Microscopy and Microanalysis



Invited Paper


Advances in Instrumentation and Techniques - Advances in Microstructurial Characterization Techniques

Development of a Hard X–ray Nanoprobe Beamline at the Advanced Photon Source


Maser a1, Stephenson a1, Winarski a1, Benson a1, Shu a1, Lai a1, Vogt a1 and Holt a1
a1 Argonne National Laboratory, Argonne, Illinois

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005