Mr T.:  Automated Electron Cryotomography for JEOL 2010F TEM

Volume 11
Supplement S02 - Aug 2005
PDF (1.085 MB)
Cited by Articles (CrossRef)
Cited by Articles (Google Scholar)
Citation Alert
Go to Next Abstract in TOC
Go to Previous Abstract in TOC
Blog this Article close

Copy and paste this code to insert a reference to this article in your blog or online community profile:

Highlight All
<div style="background: #FFFFFF; margin: 10px 10px 10px 10px; padding: 10px 10px 10px 20px; text-align: left; border-top: 1px dashed #a5bbd1; border-left: 10px solid #a5bbd1; font-family: Verdana, Geneva, sans-serif;"><br> <div style="font-size: 12px; padding: 0px 0px 10px 0px; font-weight:bold; color: #003366;">Mr T.: Automated Electron Cryotomography for JEOL 2010F TEM</div><br><div style="font-size: 10px;"><b>J T Chang,M Marsh,F Rixon and W Chiu (2005).</b><br /> <a href="http://journals.cambridge.org/action/displayJournal?jid=MAM">Microscopy and Microanalysis</a>, <a href="http://journals.cambridge.org/action/displayJournal?jid=MAM&volumeId=11&bVolume=y#loc11 ">Volume 11</a>, <a href="http://journals.cambridge.org/action/displayIssue?jid=MAM&volumeId=11&issueId=S02&iid=326395"> Supplement S02</a>, August 2005 pp 308-309 <br/> <a href="http://journals.cambridge.org/action/displayAbstract?aid=326395">http://journals.cambridge.org/action/displayAbstract?aid=326395</a></div></div>
The code will display like this:

Mr T.: Automated Electron Cryotomography for JEOL 2010F TEM

J T Chang, M Marsh, F Rixon and W Chiu (2005).
Microscopy and Microanalysis, Volume 11, Supplement S02, August 2005 pp 308-309 http://journals.cambridge.org/action/displayAbstract?aid=326395

Blog this Article

Microscopy and Microanalysis (2005), 11 (Suppl. 02) : 308-309 Cambridge University Press

Copyright © 2005 Microscopy Society of America

doi:10.1017/S1431927605504501 (About doi)

Published online by Cambridge University Press 01 Aug 2005

Social Bookmarking

Username or Email Address	Password

Cambridge Journals Online

Microscopy and Microanalysis (2005), 11 (Suppl. 02) : 308-309 Cambridge University Press

Copyright © 2005 Microscopy Society of America

doi:10.1017/S1431927605504501 (About doi)

Published online by Cambridge University Press 01 Aug 2005