Microscopy and Microanalysis



Invited Paper


Advances in Instrumentation and Techniques - Advances in Microstructurial Characterization Techniques

Confocal X-ray Fluorescence Imaging and XRF Tomography for Three-Dimensional Trace Element Microanalysis


Vincze a1
a1 Ghent University, Belgium

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005