Microscopy and Microanalysis

Invited Paper

Focused Interest Groups - Materials Research in an Aberration-Free Environment

Annular Dark Field Tomography in TEM

Bals a1, C F Kisielowski a2, Croitoru a1 and G Van Tendeloo a1
a1 University of Antwerp
a2 Lawrence Berkeley National Laboratory

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005