Laser and Particle Beams



Soft laser-plasma X-ray source for differential absorption imaging of tracing elements in thin samples


L. A.  GIZZI  a1 c1 , C.A.  CECCHETTI  a1 , M.  GALIMBERTI  a1 , D.  GIULIETTI  a1 a2 , A.  GIULIETTI  a1 , P.  KOESTER  a1 , L.  LABATE  a1 a3 , S.  LAVILLE  a1 and P.  TOMASSINI  a1
a1 Intense Laser Irradiation Laboratory, IPCF, Area della Ricerca CNR, Pisa, Italy
a2 Also at Dipartimento di Fisica, Università di Pisa and INFN, Pisa, Italy
a3 Also at Dipartimento di Fisica, Università di Bologna, Bologna, Italy

Article author query
gizzi la   [Google Scholar] 
cecchetti ca   [Google Scholar] 
galimberti m   [Google Scholar] 
giulietti d   [Google Scholar] 
giulietti a   [Google Scholar] 
koester p   [Google Scholar] 
labate l   [Google Scholar] 
laville s   [Google Scholar] 
tomassini p   [Google Scholar] 
 

Abstract

The differential imaging technique is particularly suitable for the detection of small concentrations of contrasts agents for biological and medical applications in samples using X-ray radiography. In this paper, we present an application of this technique using a laser-plasma soft X-ray source combined with a bent crystal. Using a Fresnel plate as a test object, we were able to obtain spatial resolutions of the order of a few tens of microns. The use of our configuration to perform differential imaging of a test-sample at the L2 edge of Br at 1,596 eV is finally demonstrated.

(Received November 1 2003)
(Accepted June 30 2004)


Key Words: Differential imaging; Laser-plasma; X-ray absorption.

Correspondence:
c1 Address correspondence and reprint requests to: L.A. Gizzi, IPCF, Intense Laser Irradiation Laboratory, CNR, Via Maruzzi 1 Pisa 56124, Italy. E-mail: la.gizzi@ipcf.cnr.it


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