Microscopy and Microanalysis

Microscopy and Microanalysis (2004), 10(Suppl 2):146-147 Cambridge University Press
Copyright © 2004 Microscopy Society of America
doi:10.1017/S1431927604884344

Invited Paper


Advances in Instrumentation and Techniques - Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Sample Preparation of Fully Packaged Quantum Well Laser Diodes for STEM-EBIC Analysis


R. Garcia a1, K.L. Bunker a1, T.J. Kennedy a1 and P.E. Russell a1
a1 North Carolina State University

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.



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