Microscopy and Microanalysis



Invited Paper


Advances in Instrumentation and Techniques - Micro X-ray Techniques: New Compositional and Structural Characterization Tools

3-D X-ray Microscopy using a Laboratory Source


Michael Feser a1, Fred Duewer a1, Steve Wang a1, David Scott a1, Alan Lyon a1 and Wenbing Yun a1
a1 Xradia Inc., Concord, California

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.