Atom Probe Tomography: A Technique for Nanoscale Characterization
Atom probe tomography is a technique for the nanoscale characterization of microstructural features. Analytical techniques have been developed to estimate the size, composition, and other parameters of features as small as 1 nm from the atom probe tomography data. These methods are outlined and illustrated with examples of yttrium-, titanium-, and oxygen-enriched particles in a mechanically alloyed, oxide-dispersion-strengthened steel.(Received October 31 2002)
(Accepted February 18 2003)
Key Words: atom probe; microstructural characterization.
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