Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

Volume 14
Issue 05 - Oct 2008
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<div style="background: #FFFFFF; margin: 10px 10px 10px 10px; padding: 10px 10px 10px 20px; text-align: left; border-top: 1px dashed #a5bbd1; border-left: 10px solid #a5bbd1; font-family: Verdana, Geneva, sans-serif;"><br> <div style="font-size: 12px; padding: 0px 0px 10px 0px; font-weight:bold; color: #003366;">Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit</div><br><div style="font-size: 10px;"><b>C. Kisielowski,B. Freitag,M. Bischoff,H. van Lin,S. Lazar,G. Knippels,P. Tiemeijer,M. van der Stam,S. von Harrach,M. Stekelenburg,M. Haider,S. Uhlemann,H. Müller,P. Hartel,B. Kabius,D. Miller,I. Petrov,E.A. Olson,T. Donchev,E.A. Kenik,A.R. Lupini,J. Bentley,S.J. Pennycook,I.M. Anderson,A.M. Minor,A.K. Schmid,T. Duden,V. Radmilovic,Q.M. Ramasse,M. Watanabe,R. Erni,E.A. Stach,P. Denes and U. Dahmen (2008).</b><br /> <a href="http://journals.cambridge.org/action/displayJournal?jid=MAM">Microscopy and Microanalysis</a>, <a href="http://journals.cambridge.org/action/displayJournal?jid=MAM&volumeId=14&bVolume=y#loc14 ">Volume 14</a>, <a href="http://journals.cambridge.org/action/displayIssue?jid=MAM&volumeId=14&issueId=05&iid=2203340"> Issue 05</a>, October 2008 pp 469-477 <br/> <a href="http://journals.cambridge.org/action/displayAbstract?aid=2203340">http://journals.cambridge.org/action/displayAbstract?aid=2203340</a></div></div>
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Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

C. Kisielowski, B. Freitag, M. Bischoff, H. van Lin, S. Lazar, G. Knippels, P. Tiemeijer, M. van der Stam, S. von Harrach, M. Stekelenburg, M. Haider, S. Uhlemann, H. Müller, P. Hartel, B. Kabius, D. Miller, I. Petrov, E.A. Olson, T. Donchev, E.A. Kenik, A.R. Lupini, J. Bentley, S.J. Pennycook, I.M. Anderson, A.M. Minor, A.K. Schmid, T. Duden, V. Radmilovic, Q.M. Ramasse, M. Watanabe, R. Erni, E.A. Stach, P. Denes and U. Dahmen (2008).
Microscopy and Microanalysis, Volume 14, Issue 05, October 2008 pp 469-477 http://journals.cambridge.org/action/displayAbstract?aid=2203340

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Microscopy and Microanalysis (2008), 14 : 469-477 Cambridge University Press

doi:10.1017/S1431927608080902 (About doi)

Published online by Cambridge University Press 16 Sep 2008

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C. Kisielowski, B. Freitag, M. Bischoff, H. van Lin, S. Lazar, G. Knippels, P. Tiemeijer, M. van der Stam, S. von Harrach, M. Stekelenburg, M. Haider, S. Uhlemann, H. Müller, P. Hartel, B. Kabius, D. Miller, I. Petrov, E.A. Olson, T. Donchev, E.A. Kenik, A.R. Lupini, J. Bentley, S.J. Pennycook, I.M. Anderson, A.M. Minor, A.K. Schmid, T. Duden, V. Radmilovic, Q.M. Ramasse, M. Watanabe, R. Erni, E.A. Stach, P. Denes and U. Dahmen (2008). Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit. Microscopy and Microanalysis, 14 , pp 469-477
doi:10.1017/S1431927608080902

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Microscopy and Microanalysis (2008), 14 : 469-477 Cambridge University Press

doi:10.1017/S1431927608080902 (About doi)

Published online by Cambridge University Press 16 Sep 2008