Microscopy and Microanalysis

Table of Contents - 2004 - Volume 10, Issue 02  


Papers from the InterAmerican Congress on Electron Microscopy

Measurement of Lattice Displacements at Planar Defects in 2H and 18R Martensites

Adriana María  Condó  a1 a2 and Francisco Carlos  Lovey  a1 c1
a1 Centro Atómico Bariloche (CNEA), 8400 S.C. de Bariloche, Argentina
a2 Consejo Nacional de Investigaciones Científicas y Técnicas, Argentina

Article author query
condo am   [PubMed][Google Scholar] 
lovey fc   [PubMed][Google Scholar] 

Abstract

A review of transmission electron microscopy studies of planar defects in 18R and 2H martensites in Cu-Zn-Al alloys is presented. The non-basal plane faults observed in the 2H structure, the F1 faults, show two kinds of dislocations at their ends. In contrast, two types of non-basal plane faults are observed in the 18R structure, Fo and Fx faults. The non-basal plane faults can be composed of segments of Fo and Fx faults. Six types of imperfect dislocations appear, depending on the type of basal plane fault ending at the non-basal plane fault. The Burgers vectors of all these dislocations have been determined from the contrast analysis of the images and HREM observations.

(Received January 30 2003)
(Accepted May 15 2003)


Key Words: Defects in martensite; stacking faults; lattice relaxation; dislocations; transmission electron microscopy; contrast analysis; image simulation; high-resolution TEM.

Correspondence:
c1 Corresponding author. E-mail: lovey@cab.cnea.gov.ar