Microscopy and Microanalysis



Invited Paper


Advances in Instrumentation and Techniques - 21st Century Scanning Microscopy - Electrons and He Ions

Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films


Trager-Cowan a1, Sweeney a2, PR Edwards a1, FL Dynowski a1, AJ Wilkinson a3, Winkelmann a4, AP Day a5, Wang a6, PJ Parbrook a6, IM Watson a1 and DC Joy a7
a1 University of Strathclyde, United Kingdom
a2 University of Sheffield, United Kingdom
a3 University of Oxford, United Kingdom
a4 Max-Planck-Institut für Mikrostrukturphysik, Germany
a5 Aunt Daisy Scientific Ltd, United Kingdom
a6 EPSRC National Centre for III-V Technologies, United Kingdom
a7 University of Tennessee"

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008