Microscopy and Microanalysis

Table of Contents - 2008 - Volume 14, Supplement S2  


Invited Paper


Advances in Instrumentation and Techniques - Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Model of Fluctuation Electron Microscopy for a Nanocrystal /Amorphous Composite

F Yi a1, WG Stratton a1 and PM Voyles a1
a1 Univeristy of Wisconsin Madison

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008