Microscopy and Microanalysis

Invited Paper

Advances in Instrumentation and Techniques - Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Simulation of Atomic Resolution Images in STEM

LJ Allen a1, AJ D'Alfonso a1, Bosman a2, SD Findlay a3, MP Oxley a4, VJ Keast a5, JM LeBeau a6 and Stemmer a6
a1 University of Melbourne, Australia
a2 The University of Sydney, Australia
a3 The University of Tokyo, Japan
a4 Oak Ridge National Laboratory
a5 The University of Newcastle, Australia
a6 University of California, Santa Barbara

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008