Microscopy and Microanalysis

Invited Paper

Advances in Instrumentation and Techniques - High Spatial and Energy Resolution EELS

Quantitative atomic-scale profiles of oxygen vacancies in SrTiO3

David A. Muller a1, Akira Ohtomo a2, John Grazul a1 and Harold Y. Hwang a1

a1 Bell Labs, Lucent Technologies, 700 Mountain Ave., Murray Hill, NJ 07974-0636
a2 Institute for Materials Research, Tohoku University,2-1-1 Katahira, Aoba, Sendai, Japan

Extended abstract of a paper presented at Microscopy and Microanalysis 2003 in San Antonio, Texas, USA, August 3 - 7, 2003.