Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Mayer, T. M.
Elam, J. W.
George, S. M.
Kotula, P. G.
and
Goeke, R. S.
2003.
Atomic-layer deposition of wear-resistant coatings for microelectromechanical devices.
Applied Physics Letters,
Vol. 82,
Issue. 17,
p.
2883.
Ohlhausen, J.A.Tony
Keenan, M.R.
Kotula, P.G.
and
Peebles, D.E.
2004.
Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA.
Applied Surface Science,
Vol. 231-232,
Issue. ,
p.
230.
Loehman, Ronald E.
and
Kotula, Paul G.
2004.
Spectral Imaging Analysis of Interfacial Reactions and Microstructures in Brazing of Alumina by a Hf‐Ag‐Cu Alloy.
Journal of the American Ceramic Society,
Vol. 87,
Issue. 1,
p.
55.
BRIGHT, D. S.
and
NEWBURY, D. E.
2004.
Maximum pixel spectrum: a new tool for detecting and recovering rare, unanticipated features from spectrum image data cubes.
Journal of Microscopy,
Vol. 216,
Issue. 2,
p.
186.
Celio, G J
Mims., C W
and
Richardson, E A
2004.
Ultrastructure and immunocytochemistry of the hostpathogen interface in poinsettia leaves infected with powdery mildew.
Canadian Journal of Botany,
Vol. 82,
Issue. 4,
p.
421.
Timlin, J.A.
Sinclair, M.B.
Haaland, D.M.
Martinez, M.J.
Manginell, M.
Brozik, S.M.
Guzowski, J.F.
and
Werner-Washburne, M.
2004.
Hyperspectral imaging of biological targets: The difference a high resolution spectral dimension and multivariate analysis can make.
Vol. 2,
Issue. ,
p.
1529.
Wilson, Bridget S.
Steinberg, Stanly L.
Liederman, Karin
Pfeiffer, Janet R.
Surviladze, Zurab
Zhang, Jun
Samelson, Lawrence E.
Yang, Li-hong
Kotula, Paul G.
and
Oliver, Janet M.
2004.
Markers for Detergent-resistant Lipid Rafts Occupy Distinct and Dynamic Domains in Native Membranes.
Molecular Biology of the Cell,
Vol. 15,
Issue. 6,
p.
2580.
Nowell, M. M.
and
Wright, S. I.
2004.
Phase differentiation via combined EBSD and XEDS.
Journal of Microscopy,
Vol. 213,
Issue. 3,
p.
296.
Havrilla, George J.
and
Miller, Thomasin
2004.
Micro X-ray fluorescence in materials characterization.
Powder Diffraction,
Vol. 19,
Issue. 2,
p.
119.
Goods, S. H.
Janek, R. P.
Buchheit, T. E.
Michael, J. R.
and
Kotula, P. G.
2004.
Oxide dispersion strengthening of nickel electrodeposits for microsystem applications.
Metallurgical and Materials Transactions A,
Vol. 35,
Issue. 8,
p.
2351.
Peebles, D. E.
Ohlhausen, J. A.
Kotula, P. G.
Hutton, S.
and
Blomfield, C.
2004.
Multivariate statistical analysis for x-ray photoelectron spectroscopy spectral imaging: Effect of image acquisition time.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 22,
Issue. 4,
p.
1579.
Van Benthem, Mark H.
and
Keenan, Michael R.
2004.
Fast algorithm for the solution of large‐scale non‐negativity‐constrained least squares problems.
Journal of Chemometrics,
Vol. 18,
Issue. 10,
p.
441.
Maharrey, S.
Bastasz, R.
Behrens, R.
Highley, A.
Hoffer, S.
Kruppa, G.
and
Whaley, J.
2004.
High mass resolution SIMS.
Applied Surface Science,
Vol. 231-232,
Issue. ,
p.
972.
Boyce, B.L.
Michael, J.R.
and
Kotula, P.G.
2004.
Fatigue of metallic microdevices and the role of fatigue-induced surface oxides.
Acta Materialia,
Vol. 52,
Issue. 6,
p.
1609.
Keenan, Michael R.
and
Kotula, Paul G.
2004.
Accounting for Poisson noise in the multivariate analysis of ToF‐SIMS spectrum images.
Surface and Interface Analysis,
Vol. 36,
Issue. 3,
p.
203.
Smentkowski, Vincent S.
(Tony) Ohlhausen, J.A.
Kotula, P.G.
and
Keenan, M.R.
2004.
Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images—looking beyond the obvious.
Applied Surface Science,
Vol. 231-232,
Issue. ,
p.
245.
Guzowski, John F
Timlin, Jerilyn A
Roysam, Badri
McNaughton, Bruce L
Worley, Paul F
and
Barnes, Carol A
2005.
Mapping behaviorally relevant neural circuits with immediate-early gene expression.
Current Opinion in Neurobiology,
Vol. 15,
Issue. 5,
p.
599.
Lee, Dongyun
Santella, M.L.
Anderson, I.M.
and
Pharr, G.M.
2005.
Thermal aging effects on the microstructure and short-term oxidation behavior of a cast Ni3Al alloy.
Intermetallics,
Vol. 13,
Issue. 2,
p.
187.
Keenan, Michael R.
2005.
Maximum likelihood principal component analysis of time-of-flight secondary ion mass spectrometry spectral images.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 23,
Issue. 4,
p.
746.
Lee, Dongyun
Santella, M. L.
Anderson, I. M.
and
Pharr, G. M.
2005.
Long-term oxidation of an as-cast Ni3Al alloy at 900 °C and 1100 °C.
Metallurgical and Materials Transactions A,
Vol. 36,
Issue. 7,
p.
1855.