Microscopy and Microanalysis

Microscopy and Microanalysis (2002), 8(Suppl 2):1264-1265CD Cambridge University Press
Copyright © 2002 Microscopy Society of America
DOI 10.1017/S1431927602104752

Contributed Paper


Physical Sciences Symposia - Microstructural Examination and Imagery of Engineering Materials

Characterization of Directionally Recrystallized Cold-rolled Nickel Using EBSP


B. Iliescu a1, J. Li a1 and I. Baker a1
a1 Thayer School of Engineering, Dartmouth College

Extended abstract of a paper presented at Microscopy and Microanalysis 2002 in Quebec City, Canada, August 4–8, 2002.



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