Microscopy and Microanalysis

Invited Paper

Advances in Instrumentation and Techniques - Quantitative X-ray Microanalysis

Benefits of Combined Evaluation of EPMA and Micro-XRF Spectra of Same Specimen in Scanning Electron Microscopes

Eggert a1, Elam a2 and Haschke a3
a1 Institut Fuer Angewandte Photonik,Germany
a3 Institute For Scientific Instruments,Germany

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007