Microscopy and Microanalysis



Invited Paper


Advances in Instrumentation and Techniques - Quantitative X-ray Microanalysis

Benefits of Combined Evaluation of EPMA and Micro-XRF Spectra of Same Specimen in Scanning Electron Microscopes


Eggert a1, Elam a2 and Haschke a3
a1 Institut Fuer Angewandte Photonik,Germany
a2 EDAX
a3 Institute For Scientific Instruments,Germany

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007