Microscopy and Microanalysis



Invited Paper


Advances in Instrumentation and Techniques - Variable Pressure Electron Microscopy and Electron Beam Assisted Deposition

In-Situ Tensile Testing of Hair Fibers in An Environmental Scanning Electron Microscope (ESEM)


Diridollou a1, Hallégot a1, Mainwaring a2, Leroy a1, VH Barbosa a1 and NJ Zaluzec a3
a1 L`Oréal Research
a2 Gatan,Inc
a3 Argonne National Laboratory

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007