Microscopy and Microanalysis

Microscopy and Microanalysis (2007), 13(Suppl 2):134-135 Cambridge University Press
Copyright © 2007 Microscopy Society of America
doi:10.1017/S1431927607071358

Invited Paper


Advances in Instrumentation and Techniques - New Phase Contrast Methods for TEM

Criteria and Prospects for Realizing Optimum Electron Microscopes


HH Rose a1
a1 Technical University Darmstadt,Germany

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007



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