Microscopy and Microanalysis



Invited Paper


Advances in Instrumentation and Techniques - New Phase Contrast Methods for TEM

Criteria and Prospects for Realizing Optimum Electron Microscopes


HH Rose a1
a1 Technical University Darmstadt,Germany

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007