Microscopy and Microanalysis


Rapid and Semi-automated Method for Analysis of the Number of Atoms of Ultra-small Platinum Clusters on Carbon


J.C.  Yang  a1, S.  Bradley  a2 and J.M.  Gibson  a1
a1 Frederick Seitz Materials Research Laboratory, University of Il linois at Urbana-Champaign, Urbana, IL 61801
a2 UOP LLC, 50 East Algonquin Road, Des Plaines, IL 60017

Very high angle (~100 mrad) annular dark-field (HAADF) images in a dedicated scanning transmission electron microscope (STEM) can be used to quantitatively measure the number of atoms in a cluster on a support material. We have developed a computer program which will automatically find the location of the particles and then integrate the intensity to find the number of atoms per cluster. We have examined ultra-small Pt clusters on a C substrate by this novel mass-spectroscopic technique. We discovered that the Pt clusters maintain their three-dimensional shape, and are probably spherical.