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Site-Specific Manipulation of CNTs to EXpressLO™ Grids for TEM Analysis

Published online by Cambridge University Press:  25 July 2016

Paul A. Anzalone  and
Lucille A. Giannuzzi
Paul A. Anzalone
Affiliation:
Nanocomp Technologies, Inc., Merrimack, NHUSA
Lucille A. Giannuzzi
Affiliation:
EXpressLO LLC, Lehigh Acres, FLUSA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1744 - 1745
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Decker, J.E., et al., Metrologia 46 (2009). p. 682.Google Scholar
[2] Novoselov, K.S., et al., Science 306 (2004). p. 666.Google Scholar
[3] Giannuzzi, L.A., et al., Microsc. Microanal 21 (2015). p. 1032.Google Scholar
[4] Giannuzzi, L.A. & Stevie, F.A. (Eds) Intro. to Focused Ion Beams (2005) Springer, 222–223.Google Scholar
[5] <underline>www.YouTube.com/LAGiannuzzi/videos</underline>.www.YouTube.com/LAGiannuzzi/videos.>Google Scholar
[6] TEM images were obtained using an FEI Talos F200X at The Pennsylvania State University MCL.Google Scholar