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Improvement of Imaging Performance with a New ASCOR Probe-Corrector in a 200 kV JEM-ARM200CF

Published online by Cambridge University Press:  25 July 2016

M. Watanabe ,
T. Nakamura  and
T. Ishikawa
M. Watanabe
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA 18015
T. Nakamura
Affiliation:
JEOL USA Inc.. Peabody, MA 01960
T. Ishikawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, 196-8558, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 310 - 311
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Watanabe, M. in Scanning Transmission Electron Microscopy (Eds. by S.J. Pennycook & P.D. Nellist, Springer NY (2011). p. 291.Google Scholar
[2] The author (MW) wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229.Google Scholar