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Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction

Published online by Cambridge University Press:  08 June 2016

Xian Chen ,
Catherine Dejoie ,
Tengfei Jiang ,
Ching-Shun Ku  and
Nobumichi Tamura
Xian Chen
Affiliation:
Department of Mechanical and Aerospace Engineering, Hong Kong University of Science and Technology, Hong Kong; xianchen@ust.hk
Catherine Dejoie
Affiliation:
Department of Materials, ETH Zürich, Switzerland; c.dejoie@mat.ethz.ch
Tengfei Jiang
Affiliation:
Department of Materials Science and Engineering and Advanced Materials Processing and Analysis Center, University of Central Florida, USA; Tengfei.Jiang@ucf.edu
Ching-Shun Ku
Affiliation:
Scientific Research Division, National Synchrotron Radiation Research Center, Taiwan; csku@nsrrc.org.tw
Nobumichi Tamura
Affiliation:
Advanced Light Source, Lawrence Berkeley National Laboratory, USA; ntamura@lbl.gov
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Abstract

Local crystal structure, crystal orientation, and crystal deformation can all be probed by Laue diffraction using a submicron x-ray beam. This technique, employed at a synchrotron facility, is particularly suitable for fast mapping the mechanical and microstructural properties of inhomogeneous multiphase polycrystalline samples, as well as imperfect epitaxial films or crystals. As synchrotron Laue x-ray microdiffraction enters its 20th year of existence and new synchrotron nanoprobe facilities are being built and commissioned around the world, we take the opportunity to overview current capabilities as well as the latest technical developments. Fast data collection provided by state-of-the-art area detectors and fully automated pattern indexing algorithms optimized for speed make it possible to map large portions of a sample with fine step size and obtain quantitative images of its microstructure in near real time. We extrapolate how the technique is anticipated to evolve in the near future and its potential emerging applications at a free-electron laser facility.

Keywords

x-ray diffraction (XRD)crystallographic structurephase transformation
Type
Research Article
Information
MRS Bulletin , Volume 41 , Issue 6: Synchrotron Radiation Research in Materials Science , June 2016 , pp. 445 - 453
Copyright
Copyright © Materials Research Society 2016 

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