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Defect Healing of Carbon Nanotubes by Rapid Vacuum Arc Annealing

Published online by Cambridge University Press:  01 February 2011

Jeff Tsung-Hui Tsai
Affiliation:
thtsai@ttu.edu.tw, Tatung University, Graduate Institute of Electro-Optical Engineering, No.40, Sec. 3, Jhongshan N. Rd., Taipei, N/A, Taiwan, +886 25925252 ext 2970
Jason Li
Affiliation:
ponut@pchome.com.tw, Tatung University, Graduate Institute of Electro-Optical Engineering, No.40, Sec. 3, Jhongshan N. Rd., Taipei, 10452, Taiwan
Andy Tseng
Affiliation:
casualmasa@gmail.com, Tatung University, Graduate Institute of Electro-Optical Engineering, No.40, Sec. 3, Jhongshan N. Rd., Taipei, 10452, Taiwan
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Abstract

A rapid thermal annealing process is demonstrated for healing the defects in carbon nanotubes using a DC vacuum arc discharge system. Multi-walled carbon nanotubes (MWCNTs) grown by chemical vapor deposition at a relatively low temperature (∼650 °C) showed structural imperfections inside the tubes which are known as "bamboo-like" defects. These defects can be thermally annealed to reconstruct the graphitic structure. A vacuum arc discharge system was used to generate high temperatures (∼1800 °C) followed by rapid cooling. The MWCNTs can be rapidly annealed in such a system by several heating and cooling cycles. The annealed samples were characterized by Raman spectroscopy and transmission electron microscopy. The defects were found to be healed when the environment contained water vapor, indicating that oxygen may play an important role in breaking the imperfect graphitic structure and removing the weakly bonded defects during the rapid heating cycles. After breaking the “bamboo” segment, the graphene shell was then reconstructed during the cooling process to produce multi-shell perfection. This method produces effective defect healing and bamboo structure removal from MWCNTs.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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References

REFERENCES

1. Munoz-Navia, M., Dorantes-Davila, J., Terrones, M., Hayashi, T., Kim, Y. A., Endo, M., Dresselhaus, M.S., and Terrones, H. Chem. Phys. Lett., 407, 327 (2005).Google Scholar
2. Kim, Y. A., Muramatsu, H., Hayashi, T., Endo, M., Terrones, M., and Dresselhaus, M. S. Chem. Phys. Lett., 398, 87 (2004).Google Scholar
3. Yudasaka, M., Ichihashi, T., Kasuya, D., Kataura, H., and Iijima, S. Carbon, 41, 1273 (2003).Google Scholar
4. Zhong, R., Cong, H., and Liu, C. Carbon, 40, 2970 (2002).Google Scholar
5. Gutiérrez, H. R., Kim, U. J., Kim, J. P., and Eklund, P. C. Nano Lett., 5, 2195 (2005).Google Scholar
6. Andrews, R., Jacques, D., Qian, D. and Dickey, E. C. Carbon, 39, 1681 (2001).Google Scholar
7. Tans, S. J., Verschueren, A. R. M., and Dekker, C. Nature, 393, 49 (1998).Google Scholar
8. Bachtold, A., Hadley, P., Nakanishi, T., and Dekker, C. Science, 294, 1317 (2001).Google Scholar
9. Naeemi, A., Sarvari, R., and Meindl, J. D. IEEE Elect. Dev. Lett., 26, 84 (2005).Google Scholar
10. Ahmad, K., Pan, W., and Shi, S. L. Appl. Phys. Lett., 89, 133122 (2006).Google Scholar
11. Dai, H. J., Wong, E.W., and Lieber, C. M. Science,272, 523 (1996).Google Scholar
12. Wang, Y., Wu, J., and Wei, F. Carbon, 41, 2939 (2003).Google Scholar
13. Chen, C. C., Chen, C. F., Chen, C. M., and Chuang, F. T. Electrochemistry Communications, 9, 159 (2007).Google Scholar
14. Tsai, J. T. H., and Chen, K. H. International Journal of Nanoscience, 4, 431 (2005).Google Scholar
15. Zhang, X. X., Li, Z. Q., Wen, G. H., Fung, K. K., Chen, J., and Li, Y. Chem. Phys. Lett., 333, 509 (2001).Google Scholar
16. Ewels, C. P., and Glerup, M. J. Nanoscience and Nanotechnology, 5, 1345 (2005).Google Scholar
17. Li, J. L., Kudin, K. N., McAllister, M. J., Prud'homme, R. K., Aksay, I. A., and Car, R. Phys. Rev. Lett., 96, 176101 (2006).Google Scholar