Microscopy and Microanalysis

Microscopy and Microanalysis (2007), 13:104-105 Cambridge University Press
Copyright © 2007 Microscopy Society of America
doi:10.1017/S143192760708052X

Invited Paper


Instrumentation and Methods - Specimen Preparation Techniques

FIB Preparation of Holes with Large Aspect Ratio


Thomas a1, Wendrock a1, Arnold a1 and Lohse a1
a1 IFW Dresden,Germany

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007



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