Microscopy and Microanalysis (2008), 14 : 315-320 Cambridge University Press
doi:10.1017/S1431927608080653 (About doi)
Published online by Cambridge University Press 04 Jul 2008
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http://journals.cambridge.org/action/displayAbstract?aid=1928960
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Michael F. Russo,
Mostafa Maazouz,
Lucille A. Giannuzzi,
Clive Chandler,
Mark Utlaut
and Barbara J. Garrison
(2008).
Gallium-Induced Milling of Silicon: A Computational Investigation of Focused Ion Beams. Microscopy and Microanalysis,
14
,
pp 315-320
doi:10.1017/S1431927608080653
doi:10.1017/S1431927608080653
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