Hostname: page-component-8448b6f56d-m8qmq Total loading time: 0 Render date: 2024-04-25T03:50:05.948Z Has data issue: false hasContentIssue false

Nanopattern Formation by Periodic Array of Interfacial Misfit Dislocations in Bi(111)/Si(001) Heteroepitaxy

Published online by Cambridge University Press:  01 February 2011

Giriraj Jnawali
Affiliation:
gr.jnawali@uni-due.de, University of Duisburg-Essen, Department of Physics, Lotherstr. 1, Duisburg, 47057, Germany, 0049-203-3791478, 0049-203-3791555
H. Hattab
Affiliation:
hichem.hattab@uni-due.de, University of Duisburg-Essen, Center for Nanointegration (CeNIDE), Department of Physics, Lotherstr. 1, Duisburg, 47057, Germany
C. Bobisch
Affiliation:
christian.bobisch@uni-due.de, University of Duisburg-Essen, Center for Nanointegration (CeNIDE), Department of Physics, Lotherstr. 1, Duisburg, 47057, Germany
A. Bernhart
Affiliation:
alexander.bernhart@stud.uni-due.de, University of Duisburg-Essen, Center for Nanointegration (CeNIDE), Department of Physics, Lotherstr. 1, Duisburg, 47057, Germany
E. Zubkov
Affiliation:
evgeny.zubkov@stud.uni-due.de, University of Duisburg-Essen, Center for Nanointegration (CeNIDE), Department of Physics, Lotherstr. 1, Duisburg, 47057, Germany
F.-J. Meyer zu Heringdorf
Affiliation:
meyerzh@uni-due.de, University of Duisburg-Essen, Center for Nanointegration (CeNIDE), Department of Physics, Lotherstr. 1, Duisburg, 47057, Germany
R. Möller
Affiliation:
rolf.moeller@uni-due.de, University of Duisburg-Essen, Center for Nanointegration (CeNIDE), Department of Physics, Lotherstr. 1, Duisburg, 47057, Germany
B. Krenzer
Affiliation:
boris.krenzer@uni-due.de, University of Duisburg-Essen, Center for Nanointegration (CeNIDE), Department of Physics, Lotherstr. 1, Duisburg, 47057, Germany
M. Horn-von Hoegen
Affiliation:
horn-von-hoegen@uni-due.de, University of Duisburg-Essen, Center for Nanointegration (CeNIDE), Department of Physics, Lotherstr. 1, Duisburg, 47057, Germany
Get access

Abstract

Despite their large lattice mismatch of 18 %, the lattices of Bi(111) and Si(001) fit surprisingly well. A remaining compressive strain in the Bi film of 2.3 % along the direction is accommodated by the formation of a periodic array of edge-type misfit dislocations confined to the interface. The strain fields surrounding each dislocation interact with each other, producing a quasi-periodic nanopattern of grating-like periodic height undulations on the surface. The separation and the amplitude of the height undulations have been derived by spot profile analyzing LEED and STM surface height profiles. The observed undulations agree well with elasticity theory.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Smith, G. E, Baraff, G. A, and Rowell, J. M, Phys. Rev. 135, A1118 (1964).Google Scholar
2. Hofmann, Ph., Prog. Surf. Sci. 81, 191 (2006).Google Scholar
3. Reneker, D. H, Phys. Rev. Lett. 1, 440 (1958).Google Scholar
4. Komnik, Y. F, Bukhshtab, E. I, Nikitin, Y. V, and Andrievskii, V. V, Sov. Phys. JETP 33, 364 (1971).Google Scholar
5. Garcia, N., Kao, Y. H, and Strongin, M., Phys. Rev. B 5, 2029 (1972).Google Scholar
6. Lu, M., Zieve, R. J, Hulst, A. van, Jaeger, H. M, Rosenbaum, T. F, and Radelaar, S., Phys. Rev. B 53, 1609 (1996).Google Scholar
7. Yang, F. Y, Liu, K., Hong, K., Reich, D. H, Searson, P. C, and Chien, C. L, Science 284, 1335 (1999).Google Scholar
8. Horn-von-Hoegen, M., Al-Falou, A., Pietsch, H., Müller, B. H., and Henzler, M., Surf. Sci. 298, 29 (1993).Google Scholar
9. Voigtländer, B., and Theuerkauf, N., Surf. Sci. 461, L575 (2000).Google Scholar
10. Hoegen, M. Horn-von, Schmidt, T., Meyer, G., Winau, D. and Rieder, K.H., Phys. Rev. B 52, 10764 (1995).Google Scholar
11. Brune, H., Giovannini, M., Bromann, K., and Kern, K., Nature 394, 451 (1998).Google Scholar
12. Chambliss, D. D, Wilson, R. J, Chiang, S., Phys. Rev. Lett. 66, 1721 (1991).Google Scholar
13. Hoegen, M. Horn-von, Krist, Z.. 214 591 and 684 (1999).Google Scholar
14. Jnawali, G., Hattab, H., Krenzer, B., and Hoegen, M. Horn-von, Phys. Rev. B 74, 195340 (2006).Google Scholar
15. Jnawali, G., Hattab, H., Heringdorf, F.-J. Meyer zu, Krenzer, B., and Hoegen, M. Horn-von, Phys. Rev. B 76, 035337 (2007).Google Scholar
16. Springholz, G., Appl. Surf. Sci. 112, 12 (1997).Google Scholar
17. Filimonov, S. N, Cherepanov, V., Paul, N., Asaoka, H., Brona, J. and B. Voigtländer, Surf. Sci. 599, 76 (2005).Google Scholar
18. Bobisch, C., Bannani, A., Matena, M., and Möller, R., Nanotechnology 18, 055606 (2007).Google Scholar