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Multifrequency Atomic Force Microscopy: Compositional Imaging with Electrostatic Force Measurements

Published online by Cambridge University Press:  19 July 2011

Sergei Magonov  and
John Alexander
Sergei Magonov*
Affiliation:
Agilent Technologies, 4330 Chandler Blvd., Chandler, AZ 85284, USA
John Alexander
Affiliation:
Agilent Technologies, 4330 Chandler Blvd., Chandler, AZ 85284, USA
*
Corresponding author. E-mail: magonov@ntmdt.us
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Abstract

We demonstrate that single-pass Kelvin force microscopy (KFM) and dC/dz measurements in different environments expand the compositional imaging with atomic force microscopy. The KFM and dC/dz studies were performed in the intermittent contact mode with force gradient detection of tip-sample electrostatic interactions. Both factors contribute to sensitive measurements of the surface potential and capacitance gradient with nanometer-scale spatial resolution as it was verified on a broad range of materials: metal alloys, polymers, organic layers, and liquid-like objects. For many samples the surface potential and dC/dz variations complement each other in identification of individual components of heterogeneous materials. In situ imaging in different humidity or vapors of various organic solvents further facilitate recognition of the constituents of multicomponent polymer samples due to selective swelling of components.

Keywords

atomic force microscopyKelvin force microscopyelectric force microscopyfrequency modulationfluoroalkanes
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 17 , Issue 4 , August 2011 , pp. 587 - 597
Copyright
Copyright © Microscopy Society of America 2011

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References

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