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Slow and Fast Atomic Motion Observed by Aberration-Corrected STEM

Published online by Cambridge University Press:  01 August 2010

OL Krivanek
Affiliation:
Nion Co
N Dellby
Affiliation:
Nion Co
MF Murfitt
Affiliation:
Nion Co
ZS Szilagyi
Affiliation:
Nion Co
MF Chisholm
Affiliation:
Oak Ridge National Laboratory
K Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010