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The most powerful tool for the structural analysis of tungsten suboxide nanowires: Raman spectroscopy

Published online by Cambridge University Press:  31 January 2011

Dong Yu Lu
Affiliation:
State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Materials and Technologies, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China
Jian Chen*
Affiliation:
State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Materials and Technologies, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China; and Instrumentation Analysis and Research Center, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China
Shao Zhi Deng
Affiliation:
State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Materials and Technologies, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China
Ning Sheng Xu*
Affiliation:
State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Province Key Laboratory of Display Materials and Technologies, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China
Wei Hong Zhang
Affiliation:
Instrumentation Analysis and Research Center, Sun Yat-Sen (Zhongshan) University, Guangzhou 510275, People’s Republic of China
*
a) Address all correspondence to these authors. e-mail: puscj@mail.sysu.edu.cn
b) Address all correspondence to these authors. e-mail: stsxns@mail.sysu.edu.cn
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Abstract

Crystalline tungsten suboxide nanowires were grown on silicon substrates by thermal evaporation of tungsten powder in a flow of argon gas without any catalyst. With different growth temperatures, two kinds of tungsten suboxide nanowires (W18O49 and W20O58) were obtained. The structures, morphologies, and compositions of these two nanowires were characterized by scanning electron microscopy (SEM), electron probe microanalyzer (EPMA), x-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), x-ray photoelectron spectroscopy (XPS), and Raman techniques. The results show that XRD and TEM are not good characterization techniques for identifying W18O49 and W20O58 nanowires; however, Raman spectroscopy (RS) is a powerful tool to distinguish the difference between them. This is due to the notable molecular bond contributing to the vibrational frequency.

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Articles
Copyright
Copyright © Materials Research Society 2007

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References

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