Hostname: page-component-848d4c4894-ndmmz Total loading time: 0 Render date: 2024-05-16T01:51:24.567Z Has data issue: false hasContentIssue false
  • English
  • Français

High-resolution X-ray spectroscopic diagnostics of laser-heated and ICF plasmas

Published online by Cambridge University Press:  09 March 2009

A. A. Hauer ,
N. D. Delamater  and
Z. M. Koenig
A. A. Hauer
Affiliation:
Los Alamos National Laboratory, Los Alamos, New Mexico;
N. D. Delamater
Affiliation:
KMS Fusion, Ann Arbor, Michigan
Z. M. Koenig
Affiliation:
KMS Fusion, Ann Arbor, Michigan
Get access Rights & Permissions [Opens in a new window]

Abstract

This article presents a review of X-ray spectroscopic diagnostic and measurement techniques as applied to laser plasma interaction and laser fusion studies. As a matter of definition we restrict our attention to the range of a several hundred eV to about 100 keV. We deal with both the basic measurement concepts and the instrumental techniques. First a brief review of the physical phenomena and parameter ranges involved is given. We then deal with specific X-ray spectroscopic instruments and methods that are useful in laser plasma X-ray spectroscopy. A discussion is given of various modeling techniques and how they can be compared with experimental measurements.

Type
Research Article
Information
Laser and Particle Beams , Volume 9 , Issue 1 , March 1991 , pp. 3 - 48
Copyright
Copyright © Cambridge University Press 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Alexandropoulos, N. G. & Cohen, G. G., 1974 Appl. Spect. 28 2.CrossRefGoogle Scholar
Apruzese, J. P., Davis, J. & Whitney, K. G. 1976 J. App. Phys. 47, 4433.CrossRefGoogle Scholar
Audebert, T. P. et al. 1984 Phys. Rev. A 30, 1582.CrossRefGoogle Scholar
Bates, D. R., Kingston, A. E., & McWhirter, R. W. P. 1962 Proc. Roy. Soc. A 267, 297.Google Scholar
Batterman, B. W. & Cole, H. 1964 Rev. of Mod. Physics 36, 681.CrossRefGoogle Scholar
Behrino, W. E. et al. 1988 App. Opt. 27, 2762.CrossRefGoogle Scholar
Benjamin, R. F., Lyons, P. B. & Day, R. H. 1977 App. Opt. 16, 393.CrossRefGoogle Scholar
Bertin, E. P. 1975 Principles of X-Ray Spectrometric Analysis (Plenum, New York) 207.CrossRefGoogle Scholar
Birks, L. S. 1970 Rev. Sci. Instnm. 41, 1129.CrossRefGoogle Scholar
Boiko, V. A. et al. 1982 Opt. Spec., 52, 259.Google Scholar
Boiko, V. A. et al. 1985 J. Sov. Laser Res. 6, 85.Google Scholar
Brown, D. B., Criss, J. W. & Birks, L. S. 1976 J. App. Phys.Google Scholar
Burek, A. J. 1976 Space Sci. Inst. 2, 53.Google Scholar
Ceglio, N. M. 1981 AIP Conf. Proc.(Attwood & Henke, eds.) 75, 210.Google Scholar
Ceglio, N. M. & Medecki, H. 1986 SPIE Proc. 688, 26.CrossRefGoogle Scholar
Clark, R. W. 1987 Los Alamos National Laboratory publication LALP-87–30, p. 2A3.Google Scholar
Cobble, J. A. et al. 1989 Phys. Rev. A.Google Scholar
Colombant, D. G. et al. 1975 Phys Fluids 18, 1687.CrossRefGoogle Scholar
Cooper, J. 1966 Rpt. Prog. Phys. 29, 35.CrossRefGoogle Scholar
Cosslett, V. E. & Nixon, W. C. 1960 X-Ray Microscopy (Cambridge University Press, New York).Google Scholar
Darwin, C. G. 1914 Phil. Mag. 27:315; 675.CrossRefGoogle Scholar
Delameter, N. et al. 1985 Phys. Rev. A 31, 2460.CrossRefGoogle Scholar
Demichelis, C. & Mattioli, M. 1981 Nucl. Fusion 21, 677.CrossRefGoogle Scholar
Duston, D., Clark, R. & Davis, J. 1985 Phys. Rev. A.Google Scholar
Duston, D. & Davis, J. 1980 Phys Rev. A 21, 932.CrossRefGoogle Scholar
Duston, D., Davis, J. & Kepple, P. C. 1981 Phys. Rev. 24, 1505.CrossRefGoogle Scholar
Duston, D. et al. 1983 Phys. Rev. A 28, 2968.CrossRefGoogle Scholar
Eckart, M. J. et al. 1986 Rev. Sci Iustrum. 57, 2046.CrossRefGoogle Scholar
Epstein, R., Skupsky, S. & Delettrez, J. 1986 J. of Quant. Spec. Rad. Trans., 35, 131.CrossRefGoogle Scholar
Evans, K. D. & Leigh, B. 1976 Space Sci. Instnm. 2, 105–123.Google Scholar
Evans, K. D., Leigh, B., & Lewis, M. 1977 X-Ray Spect. 6(3), 132.Google Scholar
Fraenkel, B. S. 1980 Appl. Phys. Lett. 36, 341.CrossRefGoogle Scholar
Fraenkel, B. S. 1982 Appl Phys. Lett. 41, 234.CrossRefGoogle Scholar
Franks, A. 1977 Sci. Prog. (Oxford) 64, 371.Google Scholar
Gauthier, J. C. et al. 1983 J. Phys. D 16, 321.Google Scholar
Gilfrich, J. V., Nagel, D. J. & Barbee, T. W. 1982 Appl. Spec. 36, 58.CrossRefGoogle Scholar
Griem, H. R. 1964 Plasma Spectroscopy (McGraw Hill, New York) (Available from University Microfilms).Google Scholar
Griem, H. R. 1974 Spectral Line Broadening by Plasmas (Academic, New York).Google Scholar
Griem, H. R., Blaha, M. & Kepple, P. 1979 Phys. Rev. A 19, 2421.CrossRefGoogle Scholar
Hailey, C. J. et al. 1985 Rev. Sci. Instrum. 56, 1553.CrossRefGoogle Scholar
Hall, T. A. 1985 Laser Plasma Interactions 3, Hooper, M. B., ed. (SUSS Publications, Edinburgh) 341.Google Scholar
Hares, J. D. et al. 1979 Phys Rev. Lett. 42, 1216.CrossRefGoogle Scholar
Hares, J. D. 1987 SPIE Proc. 831, 165.CrossRefGoogle Scholar
Hauer, A 1981 Spectral Line Shapes, Wende, B., ed. (W. DeGruyter Berlin).Google Scholar
Hauer, A. 1983 Optics Lett. 8, 434.CrossRefGoogle Scholar
Hauer, A. & Baldis, H. 1988 Los Alamos Nat. Lab., Report LA 11178-MS, 30.Google Scholar
Hauer, A. & Baldis, H. 1989 Laser Induced Plasmas and Applications Radziemski, L. & Cremers, D., eds. (Marcel Dekker, New York) 105.Google Scholar
Hauer, A., Kilkenny, J. D. & Landen, O. L. 1984 Rev. Sci. Instrum. 56, 803.CrossRefGoogle Scholar
Hauer, A. et al. 1986 Phys Rev. A 28, 963.Google Scholar
Henke, B. L. & Jaanimagi, P. L. 1985 Rev. Sci. Instrum. 56, 1537.CrossRefGoogle Scholar
Henke, B. L., Knauer, J. P. & Premaratne, K. 1981 J. Appl. Phys. 52, 1509.CrossRefGoogle Scholar
Henke, B. L. et al. 1978 J. Appl. Phys. 54, 6138.Google Scholar
Herbst, M. et al. 1982 Rev. Sci. Instnm. 56, 803.Google Scholar
House, L. 1969 J. Astro. Suppl. 155(18), 21.CrossRefGoogle Scholar
Hulse, R. A. 1983 Nuclear Technology/Fusion 3, 259.Google Scholar
Jacobs, V. L. & Blaha, M. 1980 Phys. Rev. A 21, 525.CrossRefGoogle Scholar
Kauffman, R. L. et al. 1984 J. Quant. Spec. Rad. Trans. 32, 335.CrossRefGoogle Scholar
Kauffman, R. L., Lee, R. W., & Estabrook, K. 1987 Phys. Rev. A 35, 4286.CrossRefGoogle Scholar
Kephart, J. F., Godwin, R. P. & McCall, G. H. 1974 Appl. Phys. Lett. 25.CrossRefGoogle Scholar
Kepple, P. C. & Whiteney, K. G. 1981 U.S. Naval Research Laboratory Report 4565: Appendix.Google Scholar
Key, M. H. & Hutcheon, R. J. 1980 Adv. Atomic & Molec. Phys. 16, 201.CrossRefGoogle Scholar
Key, M. H. et al. 1979 Appl. Phys. Lett. 34, 550.CrossRefGoogle Scholar
Key, M. H. et al. 1980 Phys. Rev. Lett. 44, 1669.CrossRefGoogle Scholar
Kilkenny, J. D. et al. 1980 Phys. Rev. A 22, 2746.CrossRefGoogle Scholar
Kilkenny, J. D. et al. 1988 Rev. Sci. Instrum. 59, 1793.CrossRefGoogle Scholar
Kirpatrick, P. & Baez, A. V. 1948 J. Opt. Soc. Am. 33, 766.CrossRefGoogle Scholar
Kiyokawa, S., Yabe, T. & MoChizuki, T. 1983 JJAP 22, L722.CrossRefGoogle Scholar
Koenig, Z. M. 1988 Rev. Sci. Instrum 59, 1813.CrossRefGoogle Scholar
Koppel, L. N. 1976 Advances in X-Ray Analysis 19, 587.CrossRefGoogle Scholar
Landen, O. et al. 1984 Bull. Am. Phys. Soc. 29, 1420.Google Scholar
Landshoff, R. K. & Perez, J. D. 1976 Phys. Rev. A 13, 1619.CrossRefGoogle Scholar
Lee, C. M. & Hauer, A. 1978 Appl. Phys. Lett. 33, 692.CrossRefGoogle Scholar
Lee, R. W. 1979 J. Phys. B 12, 1129, 1144.Google Scholar
Lee, R. W. 1982 J. of Quant. Spec, and Rad. Trans. 27, 87.CrossRefGoogle Scholar
Lee, R. W., Whitten, B. L. & Stout, R. E. 1984 J. Quant. Spec. Rad. Trans. 32, 91.CrossRefGoogle Scholar
Lee, R. W. 1987 Lawrence Livermore National Laboratory Report UCID-21292.Google Scholar
Lee, Y. T. 1987 J. of Quant. Spec. Rad. Trans. 38, 131.CrossRefGoogle Scholar
Lee, Y. T. et al. 1986 Lawrence Livermore National Laboratory Report UCRL-95149.Google Scholar
Lewis, C. L. S. & McGlinchey, J. 1985 Opt. Comm. 53, 179.CrossRefGoogle Scholar
Lokke, W. A. & Grasberger, W. H. 1976 XSNQ-U, Lawrence Livermore National Laboratory Report UCRL-52276.Google Scholar
Lunney, J. G. & Seely, J. F. 1982 J. Phys. B: At. Mol. Phys. 15, L121–L127.CrossRefGoogle Scholar
Lunney, J. G. et al. 1984 Opt. Comm. 50, 6.CrossRefGoogle Scholar
Marchand, R. et al. 1988 Lasers and Particle Beams, G, 183.CrossRefGoogle Scholar
Matthews, D. L. et al. 1984 Appl. Phys. Lett. 44, 586.CrossRefGoogle Scholar
McConaghy, C. F. & Coleman, L. W. 1974 Appl. Phys. Lett. 25, 268.CrossRefGoogle Scholar
McWhirter, R. W. P. 1965 Spectral Intensities, Plasma Diagnostic Techniques, Huddlestone, R. H. & Leonard, S. L. eds. (Academic, New York).Google Scholar
Mueller, M. 1979 Optics Lett. 4, 351.CrossRefGoogle Scholar
Nilsen, J. 1988 AIP Conference Proceedings, No. 168 (Hauer & Merts, eds.) 51.Google Scholar
Phillion, D. W. & Hailey, C. J. 1986 Phys. Rev. A 34, 4886.CrossRefGoogle Scholar
Priedhorsky, W. C. et al. 1981 Phys. Rev. Lett. 47, 1661.CrossRefGoogle Scholar
Priedhorsky, W. C., Lier, D. W. & Day, R. H., 1983 Rev. Sci Instrum. (USA), 54, (12) 1605.CrossRefGoogle Scholar
Richardson, M. C. et al. 1985 SPIE Proc. 569, 149.CrossRefGoogle Scholar
Ripin, B. H. et al. 1975 Phys. Rev. Lett. 34 (21).CrossRefGoogle Scholar
Rockett, P. D. et al. 1985 Applied Optics, 24, 2536.CrossRefGoogle Scholar
Rockett, P. D. et al. 1986 SPIE Proc. 689, 114.CrossRefGoogle Scholar
Scofield, J. 1984 Private Communication. See also Landen O., Kilkenny, J. D., Scofield, J. & Hauer, A. (1984).Google Scholar
Stamm, R. & Talin, B. 1986 Phys. Rev. A 34, 4144.CrossRefGoogle Scholar
Stern, D. 1985 IDL Users Guide (Research Systems, Inc., Denver, CO).Google Scholar
Stone, S. R. & Weisheit, J. C. 1984 Lawrence Livermore National Laboratory Report UCID-20262.Google Scholar
Stone, S. R. & Weisheit, J. C. 1986 J. of Quant. Spec, and Rad. Trans. 35, 67.CrossRefGoogle Scholar
Stradling, G. L., Attwood, D. T., & Kauffman, R. L. 1983 IEEE J. Quant. Elec. QE-19, 604.CrossRefGoogle Scholar
Tighe, R. J. & Hooper, C. F. 1976 Phys. Rev. A 14, 1514.CrossRefGoogle Scholar
Underwood, J. H. & Barbee, T. W. 1981 Appl. Opt. 24, 883.Google Scholar
Von Hamos, L. 1939 Z. Kristalloger 101, 17.Google Scholar
Warren, B. E. 1968 X-Ray Diffraction, p. 315.Google Scholar
West, C. M. & Steel, D. G. 1978 Opt. Lett 3, 2.Google Scholar
Whiteney, K. G. & Davis, J. 1974 J. App. Phys. 45, 5294.CrossRefGoogle Scholar
Whiteney, K. G. & Kepple, P. C. (1982), J. Quant. Spect. and Rad. Trans. 27, 281.CrossRefGoogle Scholar
Wiza, J. L. 1979 Nucl. Instrum, and Meth. 162, 587.CrossRefGoogle Scholar
Woltz, L. A., Inglesias, C. A. & Hooper, C. F. Jr. 1982 J. Quanti. Spect. Rad. Trans. 27, 233.CrossRefGoogle Scholar
Yaakobi, B. & Burek, A. J. 1983 IEEE J. Quant. Elect. QE-19, 1841.CrossRefGoogle Scholar
Yaakobi, B., Bristow, T. C. & Hauer, A. 1975 Opt. Comm. 14, 335.CrossRefGoogle Scholar
Yaakobi, B. & Nee, A. 1976 Phys. Rev. Lett. 36, 1077.CrossRefGoogle Scholar
Yaakobi, B., Pelah, I., & Hoose, J. 1976 Phys. Rev. Lett. 37, 836.CrossRefGoogle Scholar
Yaakobi, B. et al. 1977 Phys. Rev. Lett. 39, 1526.CrossRefGoogle Scholar
Yaakobi, B. et al. 1979a Phys. Rev. A 19, 1247.CrossRefGoogle Scholar
Yaakobi, B. et al. 1979b Rev. Sci. Instrum. (USA) 50, 12, 1609.CrossRefGoogle Scholar
Young, B. K. F. et al. 1986 Rev. Sci. Instrum. 57, 2729.CrossRefGoogle Scholar
Zachariasen, W. H. 1945 Theory of X-Ray Diffraction in Crystals (Dover).Google Scholar
Ziegler, A., Zmora, H. & Komet, Y. 1977 Phys. Lett. 60, 319.CrossRefGoogle Scholar
Zimmerman, G. B. & Kruer, W. L. 1975 Comments Plasma Phys. Controlled Fusion 2, 51.Google Scholar